Sub-10 nm silicon ridge nanofabrication by advanced edge lithography for NIL applications

Zhao, Yiping and Berenschot, Erwin and Jansen, Henri and Tas, Niels and Huskens, Jurriaan and Elwenspoek, Miko (2008) Sub-10 nm silicon ridge nanofabrication by advanced edge lithography for NIL applications. Microelectronic Engineering, 86 (4-6). pp. 832-835. ISSN 0167-9317

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Abstract:	A new nanofabrication scheme is presented to form stamps useful in thermal nanoimprint lithography (T-NIL). The stamp is created in <1 1 0> single crystalline silicon using a full-wet etching procedure including local oxidation of silicon (LOCOS) and employing an adapted edge lithography technique on top of conventional photolithography. Ridges down to 10 nm in width have been produced. The silicon ridges have no inbuilt stress and are therefore less fragile than previously fabricated oxide ridges. The ridge sample is used as a template in T-NIL and a full 100 mm wafer size imprint has been successfully carried out in both polymethylmethacrylate (PMMA) and mr-I 7020E polymer. Moreover, the imprinted pattern in PMMA is subsequently transferred into a device wafer.
Item Type:	Article
Copyright:	© 2008 Elsevier
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS) Science and Technology (TNW)
Research Group:	Transducers Science and Technology (TST) Molecular Nanofabrication (MNF)
Link to this item:	http://purl.utwente.nl/publications/67588
Official URL:	http://dx.doi.org/10.1016/j.mee.2008.11.067
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