Process qualification strategy for advances embedded non volatile memory technology - the Philips'0.18um embedded flash case


Share/Save/Bookmark

Tao, Guoqiao and Scarpa, Andrea and Dijk van, Kitty and Kuper, Fred G. (2003) Process qualification strategy for advances embedded non volatile memory technology - the Philips'0.18um embedded flash case. In: 41st Annual International Reliability Physics Symposium, IRPS 2003, 30 March - 4 April 2003, Dallas, Texas, USA.

[img]PDF
Restricted to UT campus only
: Request a copy
177Kb
Abstract:A qualification strategy for advanced embedded non-volatile memory technology has been revealed. This strategy consists of: a thorough understanding of the requirements, extensive use and frequent update of the FMEA (failure mode effect analysis), a qualification plan with excellent coverage of all the risk areas, implementing effective in-line and off-line measures and control, and check-off of all the tests with good results. With such a strategy in place, the Philips 0.18 /spl mu/m embedded flash technology has been successfully qualified for volume production.
Item Type:Conference or Workshop Item
Copyright:© 2003 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:http://purl.utwente.nl/publications/67502
Official URL:http://dx.doi.org/10.1109/RELPHY.2003.1197827
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page