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The item you are trying to access was a duplicate of:
Sasse, G.T. and Kort, R. de and Schmitz, J. (2004) Gate-capacitance extraction from RF C-V measurements. In: 34th European Solid-State Device Research Conference, ESSDERC 2004, 21-23 September 2004, Leuven, Belgium (pp. pp. 113-116).