Electrical instability of A-Si:H/SiN thin film transistors : a study at room temperature and low voltage stress


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Merticaru, Andreea Ruxandra (2004) Electrical instability of A-Si:H/SiN thin film transistors : a study at room temperature and low voltage stress. thesis.

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Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/67297
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Metis ID: 218041