Reduction of hydrogen-induced optical losses of plasma-enhanced chemical vapor deposition silicon oxynitride by phosphorus doping and heat treatment

Hussein, M.G. and Wörhoff, K. and Sengo, G. and Driessen, A. (2007) Reduction of hydrogen-induced optical losses of plasma-enhanced chemical vapor deposition silicon oxynitride by phosphorus doping and heat treatment. Journal of Applied Physics, 101 (2). 023517/1-023517/6. ISSN 0021-8979

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Abstract:	Plasma enhanced chemical vapor deposition phosphoros-doped silicon oxynitride (SiON) layers with a refractive index of 1.505 were deposited from $N_{2}O$ , 2% $SiH_{4}/N_{2}$ , and 5% $PH_{3}/Ar$ gaseous mixtures. The $PH_{3}/Ar$ flow rate was varied to investigate the effect of the dopant to the layer properties. We studied the compositions and the chemical environment of phosphorus, silicon, oxygen, nitrogen and hydrogen in these layers by using x-ray photoelectron spectroscopy and Fourier transform infrared spectroscopy. The number of N-H and O-H bonds, which are responsible for optical losses around 1.55 and 1.3 μm, decreases in the as-deposited layers with increasing phosphorus concentration. Furthermore, the bonded hyrogen in all P-doped layers has been eliminated after annealing at a temperature significantly lower than required for undoped silicon oxynitride layers, that is so to say 1000°C instead of 1150°C. The resulting optical loss in the entire third telecommunication window was well below 0.2dB/cm, making P-doped SiON an attractive material for demanding integrated optics applications.
Item Type:	Article
Copyright:	© 2007 American Institute of Physics
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/67023
Official URL:	http://dx.doi.org/10.1063/1.2423219
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