Magnetic Force Microscopy - Towards higher resolution

Abelmann, Leon and Bos van den, Arnout and Lodder, Cock (2005) Magnetic Force Microscopy - Towards higher resolution. In: Magnetic Microscopy of Nanostructures. NanoScience and Technology . Springer Verlag, Berlin, pp. 253-283. ISBN 9783540401865

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Abstract:	In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high resolution and the design and realisation of MFM tips.
Item Type:	Book Section
Copyright:	© 2005 Springer
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Transducers Science and Technology (TST)
Link to this item:	http://purl.utwente.nl/publications/66340
Official URL:	http://www.springer.com/3-540-40186-5
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