Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance

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Hopman, W.C.L. and Werf van der, K.O. and Hollink, A.J.F. and Bogaerts, W. and Subramaniam, V. and Ridder de, R.M. (2006) Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance. Optics Express, 14 (19). pp. 8745-8752. ISSN 1094-4087

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Abstract:We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral
displacement at the strongest resonance antinode locations.
Item Type:Article
Copyright:© 2006 Optical Society of America
Faculty:
Science and Technology (TNW)
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/66337
Official URL:http://dx.doi.org/10.1364/OE.14.008745
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