Electron beam fabrication and characterization of high- resolution magnetic force microscopy tips

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Rührig, M. and Porthun, S. and Lodder, J.C. and McVitie, S. and Heyderman, L.J. and Johnston, A.B. and Chapman, J.N. (1996) Electron beam fabrication and characterization of high- resolution magnetic force microscopy tips. Journal of Applied Physics, 79 (6). pp. 2913-2919. ISSN 0021-8979

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Abstract:The stray field, magnetic microstructure, and switching behavior of high‐resolution electron beam fabricated thin film tips for magnetic force microscopy (MFM) are investigated with different imaging modes in a transmission electron microscope (TEM). As the tiny smooth carbon needles covered with a thermally evaporated magnetic thin film are transparent to the electron energies used in these TEMs it is possible to observe both the external stray field emanating from the tips as well as their internal domain structure. The experiments confirm the basic features of electron beam fabricated thin film tips concluded from various MFM observations using these tips. Only a weak but highly concentrated stray field is observed emanating from the immediate apex region of the tip, consistent with their capability for high resolution. It also supports the negligible perturbation of the magnetization sample due to the tip stray field observed in MFM experiments. Investigation of the magnetization distributions within the tips, as well as preliminary magnetizing experiments, confirm a preferred single domain state of the high aspect ratio tips. To exclude artefacts of the observation techniques both nonmagnetic tips and those supporting different magnetization states are used for comparison.
Item Type:Article
Copyright:© 1996 American Institute of Physics
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/66150
Official URL:http://dx.doi.org/10.1063/1.361287
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Metis ID: 111898