Temperature dependent FMR on CoCr-layers


Reuvekamp, E.M.C.M. and Witte, A.M. de and Gerritsma, G.J. and Lodder, J.C. and Aarnink, W.A.M. (1989) Temperature dependent FMR on CoCr-layers. Journal of magnetism and magnetic materials, 83 (1-3). pp. 57-58. ISSN 0304-8853

open access
Abstract:Temperature dependent FMR measurements were performed on two series of rf sputtered films. The FMR measuring temperature could be varied between 77 and 300 K. There is indication of the existence of 2 CoCr phases in the film from ion-milled samples. The perpendicular anisotropy increased with both decreasing temperature and stress-relaxation by removing the substrate.
Item Type:Article
Copyright:© 1989 Elsevier
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/66149
Official URL:https://doi.org/10.1016/0304-8853(90)90429-T
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page

Metis ID: 129168