Temperature dependent FMR on CoCr-layers

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Reuvekamp, E.M.C.M. and Witte, A.M. de and Gerritsma, G.J. and Lodder, J.C. and Aarnink, W.A.M. (1989) Temperature dependent FMR on CoCr-layers. Journal of magnetism and magnetic materials, 83 (1-3). pp. 57-58. ISSN 0304-8853

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Abstract:Temperature dependent FMR measurements were performed on two series of rf sputtered films. The FMR measuring temperature could be varied between 77 and 300 K. There is indication of the existence of 2 CoCr phases in the film from ion-milled samples. The perpendicular anisotropy increased with both decreasing temperature and stress-relaxation by removing the substrate.
Item Type:Article
Copyright:© 1989 Elsevier
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/66149
Official URL:http://dx.doi.org/10.1016/0304-8853(90)90429-T
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Metis ID: 129168