A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

Share/Save/Bookmark

Lodder, J.C. and Berg, K.G. van den (1973) A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope. Journal of Microscopy, 100 . pp. 93-98. ISSN 0022-2720

open access
[img]
Preview
PDF
3MB
Item Type:Article
Copyright:© 1973 The Royal Microscopical Society
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/66121
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page