A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

Lodder, J.C. and Berg van den, K.G. (1973) A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope. Journal of Microscopy, 100 . pp. 93-98. ISSN 0022-2720

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Item Type:	Article
Copyright:	© 1973 The Royal Microscopical Society
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Transducers Science and Technology (TST) Software Engineering (SE)
Link to this item:	http://purl.utwente.nl/publications/66121
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