Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy

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Lintelo te, J.G.Th. and Lodder, J.C. and McVitie, S. and Chapman, J.N. (1994) Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy. Journal of Applied Physics, 75 (6). pp. 3002-3007. ISSN 0021-8979

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Abstract:Magnetic stray fields of Co‐Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.
Item Type:Article
Copyright:© 1994 American Institute of Physics
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/66119
Official URL:http://link.aip.org/link/doi/10.1063/1.356166
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Metis ID: 112368