Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films

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Kemner, K.M. and Harris, V.G. and Elam, W.T. and Lodder, J.C. (1994) Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films. IEEE Transactions on Magnetics, 30 . pp. 4017-4019. ISSN 0018-9464

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Electrical Engineering, Mathematics and Computer Science (EEMCS)
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