Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films

Kemner, K.M. and Harris, V.G. and Elam, W.T. and Lodder, J.C. (1994) Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films. IEEE Transactions on Magnetics, 30 . pp. 4017-4019. ISSN 0018-9464

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Item Type:	Article
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:	http://purl.utwente.nl/publications/66105
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