The field dependence of the domain period in CoCr films

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Kaczer, J. and Simsova, J. and Gemperle, R. and Murtinova, L. and Lodder, J.C. (1988) The field dependence of the domain period in CoCr films. Journal of physics, c8 . p. 49.

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Abstract:The dependence of the submicron domain period of CoCr films in ascending and descending fields (dc: 8-320 kA/m; superposed ac: 0-55 kA/m) normal to the surface was investigated using the colloid-SEM method. Low coercivity samples (Hc/Hk ~ 0.02) were measured. Comparison with calculations furnished fair agreement in contradistinction to samples having H c/Hk ~ 0.05. The exchange constant A was deteremined from the thickness dependence of the domain period.
Item Type:Article
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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