The field dependence of the domain period in CoCr films


Kaczer, J. and Simsova, J. and Gemperle, R. and Murtinova, L. and Lodder, J.C. (1988) The field dependence of the domain period in CoCr films. Journal de Physique, c8 . p. 49. ISSN 0302-0738

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Abstract:The dependence of the submicron domain period of CoCr films in ascending and descending fields (dc: 8-320 kA/m; superposed ac: 0-55 kA/m) normal to the surface was investigated using the colloid-SEM method. Low coercivity samples (Hc/Hk ~ 0.02) were measured. Comparison with calculations furnished fair agreement in contradistinction to samples having H c/Hk ~ 0.05. The exchange constant A was deteremined from the thickness dependence of the domain period.
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Electrical Engineering, Mathematics and Computer Science (EEMCS)
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