A combined optical and magneto-optical measurement system


Geerts, W.J.M.A. and Lodder, J.C. and Popma, Th.J.A. (1992) A combined optical and magneto-optical measurement system. Review of Scientific Instruments, 63 (2). pp. 1805-1809. ISSN 0034-6748

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Abstract:A magneto-optical (MO) Kerr tracer based on an ellipsometer was developed for studying the surface magnetic properties of thin films. This system can be used to measure the optical properties n and k, which are strongly related to the magneto-optical parameters qk and hk. In order to carry out measurements on materials having a small qk we have developed a multiple reflection sample holder which gives an enhancement of the rotation. The behavior of the sample holder is explained in terms of Jones matrices. The optical and magneto-optical properties for a thickness series of Co-Cr films were measured. Comparative measurements on other systems gave similar results.
Item Type:Article
Additional information:Imported from SMI Reference manager
Copyright:© 1992 American Institute of Physics
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:http://purl.utwente.nl/publications/66096
Official URL:https://doi.org/10.1063/1.1143341
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