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A combined optical and magneto-optical measurement system
Geerts, W.J.M.A. and Lodder, J.C. and Popma, Th.J.A. (1992) A combined optical and magneto-optical measurement system. Review of Scientific Instruments, 63 (2). pp. 1805-1809. ISSN 0034-6748
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| Abstract: | A magneto-optical (MO) Kerr tracer based on an ellipsometer was developed for studying the surface magnetic properties of thin films. This system can be used to measure the optical properties n and k, which are strongly related to the magneto-optical parameters qk and hk. In order to carry out measurements on materials having a small qk we have developed a multiple reflection sample holder which gives an enhancement of the rotation. The behavior of the sample holder is explained in terms of Jones matrices. The optical and magneto-optical properties for a thickness series of Co-Cr films were measured. Comparative measurements on other systems gave similar results. |
| Item Type: | Article |
| Copyright: | © 1992 American Institute of Physics |
| Faculty: | Electrical Engineering, Mathematics and Computer Science (EEMCS) |
| Link to this item: | http://purl.utwente.nl/publications/66096 |
| Official URL: | http://dx.doi.org/10.1063/1.1143341 |
| Export this item as: | BibTeX EndNote HTML Citation Reference Manager |
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