Characterisation of slow light in a waveguide grating

Ridder de, René M. and Hopman, Wico C.L. and Hoekstra, Hugo J.W.M. (2006) Characterisation of slow light in a waveguide grating. In: International Conference on Transparent Optical Networks, ICTON 2006, 18-22 Jun 2006, Nottingham, UK.

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Abstract:	A grating was defined in a silicon nitride waveguide, using a combination of both conventional lithography and laser interference lithography. The structure was optically characterized in the 1520 – 1560 nm wavelength range by combining transmission measurements with the analysis of local out-of-plane scattered light, using a high-resolution infrared camera. From the measured power enhancement of the first Bloch-mode resonance above the long-wavelength band edge we estimated a Q > 10^4 and a group velocity of < 0.1 c.
Item Type:	Conference or Workshop Item
Copyright:	© 2006 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/65630
Official URL:	http://dx.doi.org/10.1109/ICTON.2006.248344
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