Characterisation of slow light in a waveguide grating


Ridder, René M. de and Hopman, Wico C.L. and Hoekstra, Hugo J.W.M. (2006) Characterisation of slow light in a waveguide grating. In: International Conference on Transparent Optical Networks, ICTON 2006, 18-22 Jun 2006, Nottingham, UK (pp. pp. 88-90).

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Abstract:A grating was defined in a silicon nitride waveguide, using a combination of both conventional lithography and laser interference lithography. The structure was optically characterized in the 1520 – 1560 nm wavelength range by combining transmission measurements with the analysis of local out-of-plane scattered light, using a high-resolution infrared camera. From the measured power enhancement of the first Bloch-mode resonance above the long-wavelength band edge we estimated a Q > 10^4 and a group velocity of < 0.1 c.
Item Type:Conference or Workshop Item
Copyright:© 2006 IEEE
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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