Application and evaluation of the RF charge-pumping technique

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Sasse, Guido T. and Schmitz, Jurriaan (2008) Application and evaluation of the RF charge-pumping technique. IEEE Transactions on Electron Devices, 55 (3). pp. 881-889. ISSN 0018-9383

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Abstract:In this paper, we will discuss the extendibility of the charge-pumping (CP) technique toward frequencies up to 4 GHz. Such high frequencies are attractive when a significant gate leakage current flows, obscuring the CP current at lower pumping frequencies.
It is shown that using RF gate excitation, accurate CP curves can be obtained on MOS devices with a leakage current density exceeding 1 A•cm−2 . A theoretical analysis of the trap response to RF gate voltage signals is presented, giving a clear insight on the benefits and limitations of the technique.
Item Type:Article
Copyright:© 2008 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/64659
Official URL:http://dx.doi.org/10.1109/TED.2007.915088
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