Noise and resolution in IO interferometric sensing

Hoekstra, H.J.W.M. and Lambeck, P.V. and Koster, T.M. and Uranus, H.P. (2007) Noise and resolution in IO interferometric sensing. In: European Conference on Integrated Optics, ECIO 2007, 25-27 April 2007, Copenhagen, Denmark.

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Abstract:	The paper presents a general theory for sensing devices, relating noise and device parameters to resolution of modal index changes. The theory is applied to optimise the length of a few integrated optics sensing devices, being a Mac-Zehnder interferometers and two Fabry-Perot implementations. The results enable the determination of the maximum attainable resolution, and show the crucial importance of loss.
Item Type:	Conference or Workshop Item
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/64376
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