Testable Design and Testing of Microsystems

Kerkhoff, Hans G. (2006) Testable Design and Testing of Microsystems. In: Design of Systems on a Chip: Design and Test. Springer, Berlin, pp. 211-222. ISBN 9780387324999

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Abstract:	The low internal node accessibility of microsystems and the variety of components and technologies used in these system scan be considered as a real challenge for testing these devices. Although many concept scan be applied which have already been developed for testing boards and ICs, also new aspects like sensor/actuator testing have to be considered. The choice which of the many approaches is most adequate turns out to be very application dependent. Test approaches are shown for two microsystems.
Item Type:	Book Section
Copyright:	© 2006 Springer
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/63654
Official URL:	http://dx.doi.org/10.1007/0-387-32500-X_10
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