Testable Design and Testing of Microsystems
Kerkhoff, Hans G. (2006) Testable Design and Testing of Microsystems. In: Design of Systems on a Chip: Design and Test. Springer, Berlin, pp. 211-222. ISBN 9780387324999
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|Abstract:||The low internal node accessibility of microsystems and the variety of components and technologies used in these system scan be considered as a real challenge for testing these devices.
Although many concept scan be applied which have already been developed for testing boards and ICs, also new aspects like sensor/actuator testing have to be considered. The choice which of the many approaches is most adequate turns out to be very application dependent. Test approaches are shown for two microsystems.
|Item Type:||Book Section|
|Copyright:||© 2006 Springer|
Electrical Engineering, Mathematics and Computer Science (EEMCS)
|Link to this item:||http://purl.utwente.nl/publications/63654|
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