A probabilistic coverage for on-the-fly test generation algorithms


Goga, N. (2003) A probabilistic coverage for on-the-fly test generation algorithms. In: Proceedings of the 3rd Automated Verification of Critical Systems (AVoCS '03), 2-3 April 2003, Southampton, UK.

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Abstract:This paper describes a way to compute the coverage for an on-the-fly test generation algorithm based on a probabilistic approach. The on-the-fly test generation and execution process and the development process of an implementation from a specification are viewed as a stochastic process. The probabilities of the stochastic processes are integrated in a generalized definition of coverage. The generalized formulas are instantiated for the ioco theory and for the specification of the TorX test generation algorithm.
Item Type:Conference or Workshop Item
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:http://purl.utwente.nl/publications/63328
Official URL:http://eprints.ecs.soton.ac.uk/7198/
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