Factorized Test Generation for Multi Input/Output Transition Systems

Brinksma, H. and Heerink, A.W. and Tretmans, G.J. (1998) Factorized Test Generation for Multi Input/Output Transition Systems. In: Proceedings of the IFIP TC6 11th International Workshop on Testing Communicating Systems.

PDF
Restricted to UT campus only: Request a copy
190Kb

Abstract:	Abstract In this paper we present factorized test generation techniques that can be used to generate test cases from a specification that is modelled as a labelled transition system. The test generation techniques are able to construct a sound (and complete) test suite for correctness criterion miocoF [5] by splitting up this correctness criterion into many simpler correctness criteria, and by generating tests for these simpler correctness criteria. By isolating the relevant part of the specification that is needed to generate tests for each of these simpler correctness criteria and using this part to generate tests from, test generation can be done more efficiently. These techniques are intended to keep the generation of tests from a specification feasible and manageable.
Item Type:	Conference or Workshop Item
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:	http://purl.utwente.nl/publications/63296
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Show download statistics for this publication

Repository Staff Only: item control page