Factorized Test Generation for Multi Input/Output Transition Systems


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Brinksma, H. and Heerink, A.W. and Tretmans, G.J. (1998) Factorized Test Generation for Multi Input/Output Transition Systems. In: Proceedings of the IFIP TC6 11th International Workshop on Testing Communicating Systems.

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Abstract:Abstract
In this paper we present factorized test generation techniques that can be
used to generate test cases from a specification that is modelled as a labelled
transition system. The test generation techniques are able to construct a sound
(and complete) test suite for correctness criterion miocoF [5] by splitting
up this correctness criterion into many simpler correctness criteria, and by
generating tests for these simpler correctness criteria. By isolating the relevant
part of the specification that is needed to generate tests for each of these
simpler correctness criteria and using this part to generate tests from, test
generation can be done more efficiently. These techniques are intended to
keep the generation of tests from a specification feasible and manageable.
Item Type:Conference or Workshop Item
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:http://purl.utwente.nl/publications/63296
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