Hot-electron transport through Ni80Fe20 in a spin-valve transistor

Vlutters, R. and Jansen, R. and Erve van 't, O.M.J. and Kim, S.D. and Lodder, J.C. (2001) Hot-electron transport through Ni80Fe20 in a spin-valve transistor. Journal of Applied Physics, 89 (11). pp. 7305-7307. ISSN 0021-8979

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Abstract:	Hot-electron transport in Ni80Fe20 thin films was studied using a spin-valve transistor. By varying the NiFe thickness from 10 to 100 Å we obtain an attenuation length of 43 Å for majority-spin hot electrons at 0.9 eV above the Fermi level. Based on such relatively long bulk attentuation lengths, one would expect a current transfer ratio that is much larger than the measured value. We propose that the discrepancy can be accounted for by considering interfacial scattering. Increasing the growth quality should thus provide a means to improve the current transfer ratio.
Item Type:	Article
Copyright:	© 2001 American Institute of Physics
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Transducers Science and Technology (TST)
Link to this item:	http://purl.utwente.nl/publications/63044
Official URL:	http://link.aip.org/link/doi/10.1063/1.1357853
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