Optimization of lateral resolution in magnetic force microscopy

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Porthun, S. and Abelmann, L. and Vellekoop, S.J.L. and Lodder, J.C. and Hug, H.J. (1998) Optimization of lateral resolution in magnetic force microscopy. Applied physics A: Materials science & processing, 66 (1, Suppl.). pp. 1185-1189. ISSN 0947-8396

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Abstract:Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration.
The model of the minimum detectable wavelength is then used to optimize the tip-sample configuration geometrically as well as magnetically.
Item Type:Article
Copyright:© 1998 Springer
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/63029
Official URL:http://dx.doi.org/10.1007/s003390051323
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