Obliquely sputtered Co/Cr thin film tape for bidirectional recording

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Nguyen, L.T. and Lisfi, A. and Lodder, J.C. (2003) Obliquely sputtered Co/Cr thin film tape for bidirectional recording. Journal of Applied Physics, 93 (10). pp. 7786-7788. ISSN 0021-8979

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Abstract:We report the growth and properties of a thin film tape, which can be equivalently recorded in both directions. The experimental tape consists of a 20 nm thick Co layer grown on top of a Cr underlayer 120 nm. The two layers were consecutively sputtered at incident angle of 70° at room temperature onto a rotating drum covered with a polymer substrate. In such growth geometry the running direction of drum is perpendicular to the incidence plane of arriving atoms. As a result of this configuration, a medium with a good orientation of the easy axis along the recording direction as well as a high coercivity of 180 kA/m has been prepared. Recording measurements have been carried out and illustrate the bidirectional recording behavior of this experimental tape, which seems to be very promising for high-density tape recording.
Item Type:Article
Additional information:Imported from SMI Reference manager
Copyright:© 2003 American Institute of Physics
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/63018
Official URL:http://link.aip.org/link/doi/10.1063/1.1555367
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