Track edges in metal-evaporated tape and thin metal-particle tape
Lalbahadoersing, S. and Siekman, M.H. and Groenland, J.P.J. and Luitjens, S.B. and Lodder, J.C. (2000) Track edges in metal-evaporated tape and thin metal-particle tape. Journal of Magnetism and Magnetic Materials, 219 (2). pp. 248-251. ISSN 0304-8853
| PDF Restricted to UT campus only: Request a copy 138Kb |
| Abstract: | MFM images of tracks written in ME and MP tape have been obtained. The analysis of the images concentrated on the track edges. A track written with signals of 0.5 μm wavelength overwrites a part of a track written with a wavelength of 1 μm. The sharpness of the edges was derived from MFM results. It can be seen that the MP sample shows smaller changes in sharpness of the edge with an increasing write current than ME tape. In ME tape, the region between the λ=0.5 μm and the λ=1 μm parts of the track is much wider than the original λ=1 μm edge. |
| Item Type: | Article |
| Copyright: | © 2000 Elsevier |
| Faculty: | Electrical Engineering, Mathematics and Computer Science (EEMCS) |
| Research Group: | |
| Link to this item: | http://purl.utwente.nl/publications/62989 |
| Official URL: | http://dx.doi.org/10.1016/S0304-8853(00)00442-X |
| Export this item as: | BibTeX EndNote HTML Citation Reference Manager |
Repository Staff Only: item control page
Metis ID: 112301

Show download statistics for this publication
Show download statistics for this publication