Track edges in metal-evaporated tape and thin metal-particle tape

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Lalbahadoersing, S. and Siekman, M.H. and Groenland, J.P.J. and Luitjens, S.B. and Lodder, J.C. (2000) Track edges in metal-evaporated tape and thin metal-particle tape. Journal of Magnetism and Magnetic Materials, 219 (2). pp. 248-251. ISSN 0304-8853

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Abstract:MFM images of tracks written in ME and MP tape have been obtained. The analysis of the images concentrated on the track edges. A track written with signals of 0.5 μm wavelength overwrites a part of a track written with a wavelength of 1 μm. The sharpness of the edges was derived from MFM results. It can be seen that the MP sample shows smaller changes in sharpness of the edge with an increasing write current than ME tape. In ME tape, the region between the λ=0.5 μm and the λ=1 μm parts of the track is much wider than the original λ=1 μm edge.
Item Type:Article
Copyright:© 2000 Elsevier
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/62989
Official URL:http://dx.doi.org/10.1016/S0304-8853(00)00442-X
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