AHE measurements of very thin films and nanosized dots


Kikuchi, N. and Murillo, R. and Lodder, J.C. (2005) AHE measurements of very thin films and nanosized dots. Journal of Magnetism and Magnetic Materials, 287 . pp. 320-324. ISSN 0304-8853

[img] PDF
Restricted to UT campus only
: Request a copy
Abstract:In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot arrayis prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensityof the jumps is smaller than the expected value from a total magnetization reversal of one dot.
Item Type:Article
Additional information:Imported from SMI Reference manager
Copyright:© 2005 Elsevier
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/62974
Official URL:http://dx.doi.org/10.1016/j.jmmm.2004.10.052
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page

Metis ID: 226370