AHE measurements of very thin films and nanosized dots

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Kikuchi, N. and Murillo, R. and Lodder, J.C. (2005) AHE measurements of very thin films and nanosized dots. Journal of Magnetism and Magnetic Materials, 287 . pp. 320-324. ISSN 0304-8853

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Abstract:In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot arrayis prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensityof the jumps is smaller than the expected value from a total magnetization reversal of one dot.
Item Type:Article
Additional information:Imported from SMI Reference manager
Copyright:© 2005 Elsevier
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/62974
Official URL:http://dx.doi.org/10.1016/j.jmmm.2004.10.052
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Metis ID: 226370