Observation of magnetic domains using a reflection mode scanning near-field optical microscope

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Durkam, C. and Shvets, I.V. and Lodder, J.C. (1997) Observation of magnetic domains using a reflection mode scanning near-field optical microscope. Applied Physics Letters, 70 (10). pp. 1323-1325. ISSN 0003-6951

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Abstract:It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography, showing this to be a purely magneto-optic effect.
Item Type:Article
Additional information:Imported from SMI Reference manager
Copyright:© 1997 American Institute of Physics
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:http://purl.utwente.nl/publications/62951
Official URL:http://dx.doi.org/10.1063/1.118524
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