Observation of magnetic domains using a reflection mode scanning near-field optical microscope
Durkam, C. and Shvets, I.V. and Lodder, J.C. (1997) Observation of magnetic domains using a reflection mode scanning near-field optical microscope. Applied Physics Letters, 70 (10). pp. 1323-1325. ISSN 0003-6951
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| Abstract: | It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography, showing this to be a purely magneto-optic effect. |
| Item Type: | Article |
| Copyright: | © 1997 American Institute of Physics |
| Faculty: | Electrical Engineering, Mathematics and Computer Science (EEMCS) |
| Link to this item: | http://purl.utwente.nl/publications/62951 |
| Official URL: | http://dx.doi.org/10.1063/1.118524 |
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Metis ID: 111883
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