CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy

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Bal, K. and Kirilyuk, A. and Rasing, Th. and Luo, Y. and Samwer, K. and Haast, M.A.M. and Lodder, J.C. (2001) CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy. Journal of Applied Physics, 89 (8). pp. 4670-4672. ISSN 0021-8979

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Abstract:The crystallographic contribution of the nonlinear magneto-optical response from CoNi/Pt interfaces appears to scale linearly with increasing interface roughness as determined by small angle x-ray scattering and atomic force microscopy. From the magnetic contribution it follows that the increased interface roughness causes the interface moment to turn out of plane while the bulk of the film has an in-plane magnetization.
Item Type:Article
Copyright:© 2001 American Institute of Physics
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:http://purl.utwente.nl/publications/62936
Official URL:http://dx.doi.org/10.1063/1.1342799
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