Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers


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Steen, J.L. van der and Esseni, D. and Palestri, P. and Selmi, L. (2006) Validity of the Effective Mass Approximation in Silicon and Germanium Inversion Layers. In: 11th International Workshop on Computational Electronics, IWCE, 25-27 May 2006, Vienna, Austria (pp. pp. 301-302).

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