Exploring dynamics of embedded ADC through adapted digital input stimuli


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Sheng, X. and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2008) Exploring dynamics of embedded ADC through adapted digital input stimuli. In: 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE, 18-20 Jun 2008, Vancouver, BC (pp. pp. 1-7).

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Abstract:This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.
Item Type:Conference or Workshop Item
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/62721
Official URL:http://dx.doi.org/10.1109/IMS3TW.2008.4581617
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