Exploring dynamics of embedded ADC through adapted digital input stimuli


Sheng, X. and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2008) Exploring dynamics of embedded ADC through adapted digital input stimuli. In: 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE, 18-20 Jun 2008, Vancouver, BC (pp. pp. 1-7).

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Abstract:This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.
Item Type:Conference or Workshop Item
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/62721
Official URL:http://dx.doi.org/10.1109/IMS3TW.2008.4581617
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