TTCN-3 for Distributed Testing Embedded Software
Blom, Stefan and Deiß, Thomas and Ioustinova, Natalia and Kontio, Ari and Pol, Jaco van de and Rennoch, Axel and Sidorova, Natalia (2007) TTCN-3 for Distributed Testing Embedded Software. In: 6th International Andrei Ershov Memorial Conference on Perspectives of Systems Informatics, PSI 2006, 27-30 June 2006, Novosibirsk, Russia (pp. pp. 98-111).
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|Abstract:||TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software in a target environment, the software is usually tested in the host environment. Executing in the host environment often affects the real-time behavior of the software and, consequently, the results of real-time testing.
Here we provide a semantics for host-based testing with simulated time and a a simulated-time solution for distributed testing with TTCN-3.
|Item Type:||Conference or Workshop Item|
|Copyright:||© 2007 Springer|
Electrical Engineering, Mathematics and Computer Science (EEMCS)
|Link to this item:||http://purl.utwente.nl/publications/61982|
|Export this item as:||BibTeX|
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