TTCN-3 for Distributed Testing Embedded Software


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Blom, Stefan and Deiß, Thomas and Ioustinova, Natalia and Kontio, Ari and Pol, Jaco van de and Rennoch, Axel and Sidorova, Natalia (2007) TTCN-3 for Distributed Testing Embedded Software. In: 6th International Andrei Ershov Memorial Conference on Perspectives of Systems Informatics, PSI 2006, 27-30 June 2006, Novosibirsk, Russia (pp. pp. 98-111).

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Abstract:TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software in a target environment, the software is usually tested in the host environment. Executing in the host environment often affects the real-time behavior of the software and, consequently, the results of real-time testing.
Here we provide a semantics for host-based testing with simulated time and a a simulated-time solution for distributed testing with TTCN-3.
Item Type:Conference or Workshop Item
Copyright:© 2007 Springer
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/61982
Official URL:http://dx.doi.org/10.1007/978-3-540-70881-0_11
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