Critical thickness and orbital ordering in ultrathin La0.7Sr0.3MnO3 films

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Huijben, M. and Martin, L.W. and Chu, Y.-H. and Holcomb, M.B. and Yu, P. and Rijnders, G. and Blank, D.H.A. and Ramesh, R. (2008) Critical thickness and orbital ordering in ultrathin La0.7Sr0.3MnO3 films. Physical Review B: Condensed matter and materials physics, 78 (9). 094413. ISSN 1098-0121

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Abstract:Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La0.7Sr0.3MnO3 films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO3 (001) substrate of only three unit cells (~12 Å). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x2-y2) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties.
Item Type:Article
Copyright:© 2008 American Physical Society
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/59900
Official URL:http://dx.doi.org/10.1103/PhysRevB.78.094413
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