Mixed-Signal Testability Analysis for Data-Converter IPs

Kraats van de, Araldo and Kerkhoff, Hans G. (2005) Mixed-Signal Testability Analysis for Data-Converter IPs. In: ProRISC 2005, 16th Workshop on Circuits, Systems and Signal Processing, 17-18 November 2005, Veldhoven, The Netherlands.

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Abstract:	In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.
Item Type:	Conference or Workshop Item
Copyright:	© STW, Technology Foundation 2005
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/59555
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