Test-Signal Search for Mixed-Signal Cores in a System-on-Chip


Kerkhoff, Hans G. (2004) Test-Signal Search for Mixed-Signal Cores in a System-on-Chip. In: ProRISC 2004, 15th Annual Workshop on Circuits, Systems and Signal Processing, 25-26 Nov 2004, Veldhoven, the Netherlands (pp. pp. 536-541).

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Abstract:The well-known approach towards testing mixed-signal cores is functional testing and basically measuring key parameters of the core. However, especially if performance requirements increase, and embedded cores are considered, functional testing becomes technically and economically less attractive. A more cost-effective approach could be accomplished by a combination of reduced functional tests and added structural tests. In addition, it will also improve the debugging facilities of cores. Basic problem remains the large computational effort for analogue structural testing. In this paper, we introduce the concept of Testability Transfer Function for both analogue as well as digital parts in a mixed-signal core. This opens new possibilities for efficient structural testing of embedded mixed-signal cores, thereby adding to
the quality of tests.
Item Type:Conference or Workshop Item
Copyright:© 2004 STW, Technology Foundation
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/59504
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