Modeling the diffraction process of molecular crystals: computation of X-ray scattering intensities from ab initio electron densities

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Bruning, W. and Feil, D. (1992) Modeling the diffraction process of molecular crystals: computation of X-ray scattering intensities from ab initio electron densities. Acta crystallographica Section A: Foundations of crystallography, 48 . pp. 865-872. ISSN 01087673

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Abstract:An algorithm for calculating the scattering factors of atomic fragments in molecules as defined by the Stockholder recipe is presented. This method allows the calculation, from ab initio molecular wave functions, of structure factors including individual anisotropic atomic temperature factors. These structure factors agree with the model used in most least-squares multipole-refinement procedures. Calculations on the H2O molecule illustrate the method.
Item Type:Article
Copyright:© 1992 The International Union of Crystallography
Link to this item:http://purl.utwente.nl/publications/59194
Official URL:http://dx.doi.org/10.1107/S0108767392004318
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