Novel treatment of the experimental data in the application of the maximum-entropy method to the determination of the electron-density distribution from X-ray experiments

Share/Save/Bookmark

Vries de, R.Y. and Briels, W.J. and Feil, D. (1994) Novel treatment of the experimental data in the application of the maximum-entropy method to the determination of the electron-density distribution from X-ray experiments. Acta crystallographica Section A: Foundations of crystallography, 50 . pp. 383-391. ISSN 0108-7673

[img]
Preview
PDF
992Kb
Abstract:The maximum-entropy method (MEM) has been tested on a limited set of noisy Fourier data from a known electron-density distribution (EDD). It is shown that maximizing the entropy of the EDD under the usual condition of fitting the variance of the data set does not necessarily lead to a satisfactory error distribution of the calculated reflections. The MEM property of producing the flattest EDD consistent with the data causes the calculated values of strong reflections to deviate systematically as much as possible from their measured values. Calculated values of strong reflections are usually smaller than their measured values. The use of a novel constraint on the entropy maximization greatly improves the form of the error distribution and also the calculated EDD.
Item Type:Article
Copyright:© 1994 The International Union of Crystallography
Faculty:
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/59192
Official URL:http://dx.doi.org/10.1107/S0108767393012802
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 129522