X-ray scattering and the chemical bond in N2 and CN


Groenewegen, P.P.M. and Zeevalkink, J. and Feil, D. (1971) X-ray scattering and the chemical bond in N2 and CN. Acta crystallographica Section A: Crystal physics, diffraction, theoretical and general crystallography, 27 . pp. 487-491. ISSN 0567-7394

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Abstract:X-ray scattering from the chemical bond within N2 and CN- has been studied in detail. Differences in scattering from these systems, derived from bonding and non-bonding models, are characterized by R values of ~ 0.04. Partitioning of the scattering into core and valence electron parts clearly demonstrates that the bonding effects are completely situated in the valence electron structure of the systems. Therefore, new evidence has been contributed to support valence structure analysis methods presently employed in X-ray diffraction structure studies.
Item Type:Article
Copyright:© 1971 The International Union of Crystallography
Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/59126
Official URL:https://doi.org/10.1107/S0567739471001049
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