Proximity effect in planar superconducting tunnel junctions containing Nb/NiCu superconductor/ferromagnet bilayers

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Pepe, G.P. and Latempa, R. and Parlato, L. and Ruotolo, A. and Ausanio, G. and Peluso, G. and Barone, A. and Golubov, A.A. and Fominov, Ya. V. and Kupriyanov, M. Yu. (2006) Proximity effect in planar superconducting tunnel junctions containing Nb/NiCu superconductor/ferromagnet bilayers. Physical Review B: Condensed matter and materials physics, 73 (5). 054506. ISSN 1098-0121

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Abstract:We present experimental results concerning both the fabrication and characterization of superconducting tunnel junctions containing superconductor/ferromagnet (S/F) bilayers made by niobium (S) and a weak ferromagnetic Ni0.50Cu0.50 alloy. Josephson junctions have been characterized down to T=1.4 K in terms of current-voltage I-V characteristics and Josephson critical current versus magnetic field. By means of a numerical deconvolution of the I-V data the electronic density of states on both sides of the S/F bilayer has been evaluated at low temperatures. Results have been compared with theoretical predictions from a proximity model for S/F bilayers in the dirty limit in the framework of Usadel equations for the S and F layers, respectively. The main physical parameters characterizing the proximity effect in the Nb/NiCu bilayer, such as the coherence length and the exchange field energy of the F metal, and the S/F interface parameters have been also estimated.
Item Type:Article
Copyright:© 2006 American Physical Society
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/59098
Official URL:http://dx.doi.org/10.1103/PhysRevB.73.054506
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Metis ID: 233431