Reliability engineering in RF CMOS


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Sasse, Guido Theodor (2008) Reliability engineering in RF CMOS. thesis.

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Abstract:In this thesis new developments are presented for reliability engineering in RF
CMOS. Given the increase in use of CMOS technology in applications for mobile
communication, also the reliability of CMOS for such applications becomes
increasingly important. When applied in these applications, CMOS is typically
referred to as RF CMOS, where RF stands for radio frequencies.
Item Type:Thesis
Research Group:
Link to this item:http://purl.utwente.nl/publications/59032
Official URL:http://dx.doi.org/10.3990/1.9789036526906
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