Characterization of Plasma-Polymerized Allylamine Using Waveguide Mode Spectroscopy

Share/Save/Bookmark

Os van, M.T. and Menges, B. and Foerch, R. and Vancso, G.J. and Knoll, W. (1999) Characterization of Plasma-Polymerized Allylamine Using Waveguide Mode Spectroscopy. Chemistry of Materials, 11 (11). pp. 3252-3257. ISSN 0897-4756

[img]PDF
Restricted to UT campus only
: Request a copy
76Kb
Abstract:Amine-functionalized thin films were prepared by plasma-induced deposition of allylamine. Radio frequency (rf) plasma polymerization was carried out under both continuous wave (CW) and pulsed conditions to control the film chemistry. The chemical and physical nature of plasma-polymerized allylamine films was investigated, as well as the effect of solvent treatment on the structure of the polymeric material. The film properties were studied using Waveguide Mode Spectroscopy (WaMS), which enabled an independent determination of film thickness and refractive index. Fourier transform infrared (FTIR) spectroscopy showed that changes in duty cycle led to different film chemistries. WaMS carried out on thin films (d < 60 nm) showed changes in the refractive index with increasing thickness believed to suggest intermolecular reactions occurring in the bulk while the film is depositing. All films studied showed a significant loss of soluble material from the surface upon solvent extraction. After extraction however, the films were stable and could be reversibly swollen in ethanol.
Item Type:Article
Copyright:© 1999 American Chemical Society
Faculty:
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/58998
Official URL:http://dx.doi.org/10.1021/cm991068k S0897-4756(99)01068-6
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page