Field emission to control tip-sample distance in magnetic probe recording


Febre, A.J. le and Lüttge, R. and Abelmann, L. and Lodder, J.C. (2007) Field emission to control tip-sample distance in magnetic probe recording. Journal of Physics: Conference Series, 61 . pp. 673-677. ISSN 1742-6588

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Abstract:An integrated method using field-emission to control the tip-sample distance for non-contact magnetic probe recording is presented, adopting the exponential relation between current and electric field as feedback. I/V characteristics that correspond well to field emission theory are measured using a probe coated with a 100 nm conductive diamond layer. By using feedback to control the tip-sample distance at constant current, the distance was increased by 2.8 nm per volt applied bias. The method was tested by scanning a probe coated with 20 nm chromium over a conducting nanopatterned sample, at bias voltages of 0.5V, 5.0V and 50.0V. The measurements confirm that field emission can be applied to control the tip-sample distance, with sufficient resolution and current stability for magnetic probe recording.
Item Type:Article
Additional information:International Conference on Nanoscience and Technology (ICN&T 2006) Open access article
Copyright:© 2007 IOP Publishing
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Electrical Engineering, Mathematics and Computer Science (EEMCS)
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