A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition

Wang, G.Y. and Houkes, Z. and Regtien, P.P.L. and Korsten, M.J. and Ji, G.R. (1998) A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition. In: Fourteenth International Conference on Pattern Recognition, 1998, 16-20 Aug. 1998, Brisbane, Qld..

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Abstract:	A statistical model, describing noise-disturbed invariants extracted from a surface patch of a range image, has been developed and applied to region based pose estimation and classification of 3D quadrics. The Mahalanobis distance, which yields the same results as a Baysian classifier, is used for the classification of the surface patches. The results, compared with the Euclidean distance, appear to be much more reliable
Item Type:	Conference or Workshop Item
Copyright:	© 1998 IEEE Press
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:	http://purl.utwente.nl/publications/57718
Official URL:	http://dx.doi.org/10.1109/ICPR.1998.711232
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