A simple, ultrahigh vacuum compatible scanning tunneling microscope for use at variable temperatures

Mugele, F. and Kloos, Ch. and Leiderer, P. and Moller, R. (1996) A simple, ultrahigh vacuum compatible scanning tunneling microscope for use at variable temperatures. Review of Scientific Instruments, 67 (7). pp. 2557-2559. ISSN 0034-6748

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Abstract:	We present the construction of a very compact scanning tunneling microscope (STM) which can be operated at temperatures between 4 and 350 K. The tip and a tiny tip holder are the only movable parts, whereas the sample and the piezoscanner are rigidly attached to the body of the STM. This leads to an excellent mechanical stability. The coarse approach system relies on the slip-stick principle and is operated by the same piezotube which is used for scanning. As an example of the performance of the device, images of a NbSe2 surface with atomic resolution are obtained.
Item Type:	Article
Copyright:	© 1996 American Institute of Physics
Link to this item:	http://purl.utwente.nl/publications/57274
Official URL:	http://dx.doi.org/10.1063/1.1147213
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