Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy


Luiten, D.J. and Lieshout, H.L. and Michels, F.A. and Valko, P. and Bruijn, M.P. and Kiewiet, F. and Adelerhof, D.J. and Hamster, A.W. and Brons, C.G.S. and Flokstra, J. (1996) Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 370 (1). pp. 72-74. ISSN 0168-9002

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Abstract:The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.
Item Type:Article
Copyright:© 1996 Elsevier Science
Science and Technology (TNW)
Link to this item:http://purl.utwente.nl/publications/57262
Official URL:https://doi.org/10.1016/0168-9002(95)01052-1
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