Diagnostic analysis of the charge transfer in CCDs

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Wallinga, Hans and Ruyven, Hans L.M. van (1974) Diagnostic analysis of the charge transfer in CCDs. In: 27th IEEE International Solid-State Circuits Conference 1974, 15-13 February 1974, Philadelphia, PA, USA (pp. pp. 148-149).

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Abstract:A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1¿s, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.
Item Type:Conference or Workshop Item
Copyright:© 1974 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/56118
Official URL:http://dx.doi.org/10.1109/ISSCC.1974.1155320
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