Diagnostic analysis of the charge transfer in CCDs

Wallinga, Hans and Ruyven van, Hans L.M. (1974) Diagnostic analysis of the charge transfer in CCDs. In: 27th IEEE International Solid-State Circuits Conference, Digest of Technical Papers, 1974, February 1974, Philadelphia.

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Abstract:	A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1¿s, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.
Item Type:	Conference or Workshop Item
Copyright:	©1974 IEEE
Link to this item:	http://purl.utwente.nl/publications/56118
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