Diagnostic analysis of the charge transfer in CCDs


Wallinga, Hans and Ruyven, Hans L.M. van (1974) Diagnostic analysis of the charge transfer in CCDs. In: 27th IEEE International Solid-State Circuits Conference, Digest of Technical Papers, 1974, February 1974, Philadelphia (pp. pp. 148-149).

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Abstract:A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1¿s, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.
Item Type:Conference or Workshop Item
Copyright:©1974 IEEE
Link to this item:http://purl.utwente.nl/publications/56118
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