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Testing word oriented embedded RAMs using built-in self test
Baanen, P. (1988) Testing word oriented embedded RAMs using built-in self test. In: CompEuro 1988, 11-14 April 1988, Brussels, Belgium.
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| Abstract: | The author presents a built-in self test method for word-oriented embedded static RAMs. Based on bit-oriented march tests, which are very suitable for self-test applications, word-oriented extensions are presented and analyzed for fault coverage. The self-test algorithm gives a high fault coverage for digital faults. Besides simple stuck-at faults, it detects transition faults and multiple-access faults. Also, all two-coupling faults between arbitrary pairs of cells are detected, so no knowledge of the physical placement of the cells is required. A prototype of the hardware implementation of the BIST method shows that the overhead, especially for large RAMs, is quite modest. The self-test hardware can be parameterized to size, making automatic generation by a module compiler easy |
| Item Type: | Conference or Workshop Item |
| Copyright: | ©1988 IEEE |
| Link to this item: | http://purl.utwente.nl/publications/56116 |
| Official URL: | http://dx.doi.org/10.1109/CMPEUR.1988.4952 |
| Export this item as: | BibTeX EndNote HTML Citation Reference Manager |
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