TASTE: a tool for analog system testability evaluation


Share/Save/Bookmark

Hemink, G.J. and Meijer, B.W. and Kerkhoff, H.G. (1988) TASTE: a tool for analog system testability evaluation. In: International Test Conference, 1988, 12-14 Sept. 1988, Washington, DC.

[img]
Preview
PDF
650Kb
Abstract:A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present
Item Type:Conference or Workshop Item
Copyright:©1988 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/56108
Official URL:http://dx.doi.org/10.1109/TEST.1988.207870
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page