A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

Lippe, K. and Kerkhoff, H. and Kloppers, G. and Morskieft, N. (1989) A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. In: International Conference on Microelectronic Test Structures, ICMTS 1989, 13-14 March 1989 , Edinburgh, UK.

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Abstract:	A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.
Item Type:	Conference or Workshop Item
Copyright:	©1989 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/56088
Official URL:	http://dx.doi.org/10.1109/ICMTS.1989.39313
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