MISSED: an environment for mixed-signal microsystem testing and diagnosis


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Kerkhoff, H.G. and Docherty, G. (1993) MISSED: an environment for mixed-signal microsystem testing and diagnosis. In: Second Asian Test Symposium, ATS 1993, November 16-18, 1993, Beijing, China (pp. pp. 88-93).

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Abstract:A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging
Item Type:Conference or Workshop Item
Copyright:©1993 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/56059
Official URL:http://dx.doi.org/10.1109/ATS.1993.398785
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