High resolution magnetic force microscopy using focussed ion beam modified tips
Phillips, G.N. and Siekman, M.H. and Abelmann, L. and Lodder, J.C. (2002) High resolution magnetic force microscopy using focussed ion beam modified tips. In: IEEE International Magnetics Conference, INTERMAG Europe 2002, April 28 - May 2, 2002, Amsterdam, The Netherlands.
|Abstract:||Summary form only given.
Magnetic force microscopy (MFM) is well established for imaging surface magnetic stray fields. With commercial microscopes and magnetic tips, images with 50 nm resolution are quite routine; however, obtaining higher resolutions is experimentally more demanding. Higher resolution is required for imaging patterned magnetic elements and the latest magnetic media where bit lengths are less than 40 nm. Sub-30 nm resolution images of a 20 bilayer Co/sub 50/Ni/sub 50//Pt thin film have been obtained using Si tips coated with Co and modified by focused ion beam (FIB) milling. Imaging was performed at room temperature, in air, with a Digital Instruments D13100 MFM in tapping/lift mode.
|Item Type:||Conference or Workshop Item|
Electrical Engineering, Mathematics and Computer Science (EEMCS)
|Link to this item:||http://purl.utwente.nl/publications/55897|
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