High resolution MFM: simulation of tip sharpening


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Saito, H. and Bos, A.G. van den and Abelmann, L. and Lodder, J.C. (2003) High resolution MFM: simulation of tip sharpening. In: IEEE International Magnetics Conference, INTERMAG 2003, 28 March - 3 April 2003, Boston, MA, USA.

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Abstract:In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.
Item Type:Conference or Workshop Item
Copyright:©2003 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/55851
Official URL:http://dx.doi.org/10.1109/INTMAG.2003.1230602
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