High resolution MFM: simulation of tip sharpening

Saito, H. and Bos van den, A.G. and Abelmann, L. and Lodder, J.C. (2003) High resolution MFM: simulation of tip sharpening. In: IEEE International Magnetics Conference, INTERMAG 2003, 28 March - 3 April 2003, Boston, MA, USA.

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Abstract:	In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.
Item Type:	Conference or Workshop Item
Copyright:	©2003 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Transducers Science and Technology (TST)
Link to this item:	http://purl.utwente.nl/publications/55851
Official URL:	http://dx.doi.org/10.1109/INTMAG.2003.1230602
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